[1] Liang Huaguo, Li Weidi, Xu Xiumin, Wang Haoyu, et al. A method to improve PUF reliability in FPGAs [J]. Journal of Southeast University (English Edition), 2018, 34 (1): 15-20. [doi:10.3969/j.issn.1003-7985.2018.01.003]
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A method to improve PUF reliability in FPGAs(
)
基于FPGA的提高PUF可靠性方法
)Journal of Southeast University (English Edition)[ISSN:1003-7985/CN:32-1325/N]
- Volumn:
- 34
- Issue:
- 2018 1
- Page:
- 15-20
- Research Field:
- Information and Communication Engineering
- Publishing date:
- 2018-03-20
Info
- Title:
- A method to improve PUF reliability in FPGAs
- 基于FPGA的提高PUF可靠性方法
- Author(s):
- Liang Huaguo; Li Weidi; Xu Xiumin; Wang Haoyu
- School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei 230000, China
- Keywords:
- field programmable gate array(FPGA); physical unclonable function(PUF); security; ring oscillator(RO); reliability
- PACS:
- TN918.91
- DOI:
- 10.3969/j.issn.1003-7985.2018.01.003
- Abstract:
- Due to the impact of voltage, temperature and device aging, the traditional ring oscillator-based physical unclonable functions(RO-PUF)suffers from an unreliability issue, i.e., PUF output is subject to a constant change. To improve the reliability of the PUF, a stability test scheme related to the PUF mapping unit is proposed. The scheme uses ring oscillators with multiple complexity and various frequencies as sources of interference, which are placed near the PUF prototype circuit to interfere with it. By identifying and discarding unstable slices which lead to the instability of PUF, PUF reliability can be effectively improved. Experimental results show that surrounding logic circuits with multiple complexity and multiple frequencies can identify different unstable slices, and the higher the complexity, the more unstable slices are detected. Moreover, compared with newly published PUF literature, the PUF circuit possesses better statistical characteristic of randomness and lower resource consumption. With temperatures varying from 0 to 120 ℃ and voltage fluctuating between 0.85 and 1.2 V, its uniqueness and stability can achieve 49.78% and 98.00%, respectively, which makes it better for use in the field of security.
- 传统的基于环形振荡器的物理不可克隆函数(RO-PUF)因电压、温度、器件老化等影响, 存在输出不可靠问题, 即PUF输出随时变化, 为了提高PUF的可靠性, 提出一种针对PUF映射单元的稳定性测试方案.该方案选择多复杂度和多种频率的环形振荡器作为干扰源, 放置在PUF原型电路附近对其进行干扰.通过识别和筛选掉不稳定的片, 即识别和筛选掉使PUF结果不稳定的单元, 来有效提高PUF的可靠性.实验结果表明, 不同复杂度和不同频率的周围逻辑电路可以识别出不同数量的不稳定片, 复杂度越高, 识别出的不稳定片也越多.与最新发表的PUF文献相比, 该PUF电路具有很好的统计随机性, 资源消耗低.在温度变化为0~120 ℃和电压波动为0.85~1.2 V时, 唯一性和可靠性分别达到49.78%和98.00%, 从而使其能够更好地被应用于安全领域.
References:
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Memo
- Memo:
-
Biography: Liang Huaguo(1959—), male, doctor, professor, huagulg@hfut.edu.cn.
Foundation item: The National Natural Science Foundation of China(No.61674048, 61371025, 61574052, 61604001).
Citation: Liang Huaguo, Li Weidi, Xu Xiumin, et al. A method to improve PUF reliability in FPGAs[J].Journal of Southeast University(English Edition), 2018, 34(1):15-20.DOI:10.3969/j.issn.1003-7985.2018.01.003.