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[1] Zhang Jianping, Wang Ruitao,. Life prediction for vacuum fluorescent displayusing maximum likelihood estimation [J]. Journal of Southeast University (English Edition), 2009, 25 (2): 189-192. [doi:10.3969/j.issn.1003-7985.2009.02.010]
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Life prediction for vacuum fluorescent displayusing maximum likelihood estimation()
基于极大似然法的真空荧光显示器寿命预测研究
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Journal of Southeast University (English Edition)[ISSN:1003-7985/CN:32-1325/N]

Volumn:
25
Issue:
2009 2
Page:
189-192
Research Field:
Electronic Science and Engineering
Publishing date:
2009-06-30

Info

Title:
Life prediction for vacuum fluorescent displayusing maximum likelihood estimation
基于极大似然法的真空荧光显示器寿命预测研究
Author(s):
Zhang Jianping Wang Ruitao
School of Thermal Power and Environmental Engineering, Shanghai University of Electric Power, Shanghai 200090, China
张建平 王睿韬
上海电力学院能源与环境工程学院, 上海 200090
Keywords:
vacuum fluorescent display accelerated life test constant stress Weibull distribution maximum likelihood estimation
真空荧光显示器 加速寿命试验 恒定应力 威布尔分布 极大似然法
PACS:
TN141;TN102
DOI:
10.3969/j.issn.1003-7985.2009.02.010
Abstract:
In order to obtain the life information of the vacuum fluorescent display(VFD)in a short time, a model of constant stress accelerated life tests(CSALT)is established with its filament temperature increased, and four constant stress tests are conducted.The Weibull function is applied to describe the life distribution of the VFD, and the maximum likelihood estimation(MLE)and its iterative flow chart are used to calculate the shape parameters and the scale parameters.Furthermore, the accelerated life equation is determined by the least square method, the Kolmogorov-Smirnov test is performed to verify whether the VFD life meets the Weibull distribution or not, and self-developed software is employed to predict the average life and the reliable life.Statistical data analysis results demonstrate that the test plans are feasible and versatile, that the VFD life follows the Weibull distribution, and that the VFD accelerated model satisfies the linear Arrhenius equation.The proposed method and the estimated life information of the VFD can provide some significant guideline to its manufacturers and customers.
为了在短时间内获得真空荧光显示器(VFD)的寿命信息, 通过加大其灯丝温度建立了加速寿命试验模型, 开展了4组恒定应力加速寿命试验.采用威布尔函数描述VFD寿命分布, 利用极大似然法(MLE)及其迭代流程图估计出形状参数和尺度参数.通过最小二乘法确定了VFD加速寿命方程, 对VFD寿命是否符合威布尔分布进行了Kolmogorov-Smirnov 检验, 并利用自行开发的寿命预测软件计算出平均寿命和可靠寿命.数据统计分析结果表明, 试验设计方案正确可行, VFD的寿命服从威布尔分布, VFD加速模型符合线性阿伦尼斯方程.所提出的试验方法和估计出的VFD寿命对生产厂商和用户有很强的指导意义.

References:

[1] Shyur H J, Elsayed E A, LuxhØj J T.A general hazard regression model for accelerated life testing [J].Annals of Operations Research, 1999, 91(1):263-280.
[2] Hur Jin-Huek, Lee Tae-Gu, Moon Sun-Ae, et al.Thermal reliability analysis of a BLDC motor in a high-speed axial fan by the accelerated-life test and numerical methods [J].Heat and Mass Transfer, 2008, 44(11):1355-1369.
[3] Bosc J M, Guo Yifan, Sarihan V, et al.Accelerated life testing for micro-machined chemical sensors [J].IEEE Transactions on Reliability, 1998, 47(2):135-141.
[4] Brunold S, Frei U, Carlsson B, et al.Accelerated life testing of solar absorber coatings:testing procedure and results [J].Solar Energy, 2000, 68(4):313-323.
[5] Rosenbaum Elyse, King Joseph C, Hu Chenming.Accelerated testing of SiO2 reliability [J].IEEE Transactions on Electron Devices, 1996, 43(1):70-80.
[6] Gouno Evans.An inference method for temperature step-stress accelerated life testing [J].Quality and Reliability Engineering International, 2001, 17(1):11-18.
[7] Tang L C, Goh T N, Sun Y S, et al.Planning accelerated life tests for censored two-parameter exponential distributions [J].Naval Research Logistics, 1999, 46(2):169-186.
[8] Xie Jingsong, Pecht Michael.Reliability prediction modeling of semiconductor light emitting device [J].IEEE Transactions on Device and Materials Reliability, 2003, 3(4):218-222.
[9] Zhang Jianping, Geng Xinmin.Constant-step stress accelerated life test of VFD under Weibull distribution [J].Journal of Zhejiang University:Science, 2005, 6A(7):722-727.
[10] Cao Jinhua, Chen Kan.An introduction to reliability mathematics [M].Beijing:Science Press, 1986:421-424.(in Chinese)
[11] Hu Fuzheng.Deviation correction method to maximum likelihood estimation of Weibull parameters [J].Electronic Product Reliability and Environmental Testing, 1992, 10(1):14-19.(in Chinese)
[12] Barr D R, Davidson T.A Kolmogorov-Smirnov test for censored samples[J].Technometrics, 1973, 15(4):739-757.

Memo

Memo:
Biography: Zhang Jianping(1972—), male, doctor, associate professor, jpzhanglzu@163.com.
Foundation items: Undergraduate Education Highland Construction Project of Shanghai, the Key Course Construction of Shanghai Education Committee(No.20075302), the Key Technology R& D Program of Shanghai Municipality(No.08160510600).
Citation: Zhang Jianping, Wang Ruitao.Life prediction for vacuum fluorescent display using maximum likelihood estimation[J].Journal of Southeast University(English Edition), 2009, 25(2):189-192.
Last Update: 2009-06-20