[1] Su Chun, Zhang Ye,. System reliability assessmentbased on Wiener process and competing failure analysis [J]. Journal of Southeast University (English Edition), 2010, 26 (4): 554-557. [doi:10.3969/j.issn.1003-7985.2010.04.011]
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System reliability assessmentbased on Wiener process and competing failure analysis(
)
基于Wiener过程和竞争失效分析的系统可靠性评估
)Journal of Southeast University (English Edition)[ISSN:1003-7985/CN:32-1325/N]
- Volumn:
- 26
- Issue:
- 2010 4
- Page:
- 554-557
- Research Field:
- Mathematics, Physics, Mechanics
- Publishing date:
- 2010-12-30
Info
- Title:
- System reliability assessmentbased on Wiener process and competing failure analysis
- 基于Wiener过程和竞争失效分析的系统可靠性评估
- Author(s):
- Su Chun; Zhang Ye
- School of Mechanical Engineering, Southeast University, Nanjing 211189, China
- PACS:
- TB114.3
- DOI:
- 10.3969/j.issn.1003-7985.2010.04.011
- Abstract:
- Considering the dependence and competitive relation-ship between traumatic failure and degradation, the reliability assessment of products based on competing failure analysis is studied. The hazard rate of traumatic failure is regarded as a Weibull distribution of the degradation performance, and the Wiener process is used to describe the degradation process. The parameters are estimated with the maximum likelihood estimation(MLE)method. A reliability model based on competing failure analysis is proposed. A case study of the GaAs lasers is given to validate the effectiveness of the model and its solving method. The results indicate that if only the degradation failure is considered, the estimated result will be comparably optimistic. Meanwhile, the correlation between the degradation and traumatic failure has a great influence on the accuracy of reliability assessment.
- 考虑突发失效和性能退化之间的相关性和竞争关系, 研究了基于竞争失效分析的产品可靠性评估问题.将突发失效的发生率视为性能退化量的函数, 并采用Weibull分布加以描述;利用Wiener过程描述性能退化过程, 采用极大似然估计法估计模型参数;提出了一种基于竞争失效分析的可靠性评估模型.以一种GaAs激光器性能退化和失效数据为例, 验证模型及其求解方法的有效性.结果表明:若仅考虑退化失效将使得评估结果偏向乐观, 突发失效与退化失效的相关性对可靠性评估的准确性有很大影响.
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Memo
- Memo:
-
Biography: Su Chun(1970—), male, doctor, associate professor, suchun@seu.edu.cn.
Foundation item: The National Natural Science Foundation of China(No.50405021).
Citation: Su Chun, Zhang Ye. System reliability assessment based on Wiener process and competing failure analysis[J].Journal of Southeast University(English Edition), 2010, 26(4):554-557.