[1] Su Chun, Zhang Ye,. System reliability assessmentbased on Wiener process and competing failure analysis [J]. Journal of Southeast University (English Edition), 2010, 26 (4): 554-557. [doi:10.3969/j.issn.1003-7985.2010.04.011]

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System reliability assessmentbased on Wiener process and competing failure analysis()

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Journal of Southeast University (English Edition)[ISSN:1003-7985/CN:32-1325/N]

Volumn:

26

Issue:

2010 4

Page:

554-557

Research Field:

Mathematics, Physics, Mechanics

Publishing date:

2010-12-30

Info

Title:

System reliability assessmentbased on Wiener process and competing failure analysis

Author(s):

Su Chun;  Zhang Ye

School of Mechanical Engineering, Southeast University, Nanjing 211189, China

Keywords:

degradation data;  Wiener process;  competing failure;  reliability assessment

PACS:

TB114.3

DOI:

10.3969/j.issn.1003-7985.2010.04.011

Abstract:

Considering the dependence and competitive relation-ship between traumatic failure and degradation, the reliability assessment of products based on competing failure analysis is studied. The hazard rate of traumatic failure is regarded as a Weibull distribution of the degradation performance, and the Wiener process is used to describe the degradation process. The parameters are estimated with the maximum likelihood estimation(MLE)method. A reliability model based on competing failure analysis is proposed. A case study of the GaAs lasers is given to validate the effectiveness of the model and its solving method. The results indicate that if only the degradation failure is considered, the estimated result will be comparably optimistic. Meanwhile, the correlation between the degradation and traumatic failure has a great influence on the accuracy of reliability assessment.

References:

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[13] Su Chun, Jiang Youhai. Evaluation model for products’ expected life based on performance degradation amplitude analysis[C]//Proceedings of the 8th International Conference on Reliability, Maintainability and Safety. Chengdu, China, 2009: 425-428.

Memo

Memo:

Biography: Su Chun(1970—), male, doctor, associate professor, suchun@seu.edu.cn.
Foundation item: The National Natural Science Foundation of China(No.50405021).
Citation: Su Chun, Zhang Ye. System reliability assessment based on Wiener process and competing failure analysis[J].Journal of Southeast University(English Edition), 2010, 26(4):554-557.

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